Evaluation of metrology technologies for free form surfaces

Autor:	Arámbula K., Siller H.R., De Chiffre L., Rodríguez C.A., Cantatore A.
Jazyk:	angličtina
Rok vydání:	2012
Předmět:	freeform metrology computed tomography cmm photogrammetry Technology
Zdroj:	International Journal of Metrology and Quality Engineering, Vol 3, Iss 1, Pp 55-62 (2012)
Druh dokumentu:	article
ISSN:	2107-6839 2107-6847
DOI:	10.1051/ijmqe/2012002
Popis:	This research work describes a novel approach for comparing different technologies for free form surface metrology: computerized tomography (CT), photogrammetry and coordinate measuring machines (CMM). The comparison has the aim of providing relevant information for the selection of metrology equipment when measuring free form components. Results demonstrate that there is the imperative need to assess the uncertainty and reproducibility of CT and photogrammetry measurements by applying some calibration procedures taking into account some recommendations for work piece alignment. This article also deals with costs issues, required standards, and necessary additional information when selecting inspection equipment.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/edf049a1e976428cbd74f61eaac9ef01 Zobrazit plný text záznamu View record in DOAJ Plný text ve formátu PDF