| Autor: |
S. S. Brkic, P. N. Ivanis, G. Djordjevic, B. Vasic |
| Jazyk: |
angličtina |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
Telfor Journal, Vol 6, Iss 1, Pp 2-6 (2014) |
| Druh dokumentu: |
article |
| ISSN: |
1821-3251 |
| Popis: |
In this paper we present a method for symbolic analysis of unreliable logic circuits in the presence of correlated and data-dependent gate failures, described by Markov chains. Furthermore, using this method we investigate the influence of data-dependent failures on the performance of majority logic and multiple input XOR gates. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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