Single event transient mitigation techniques for a cross‐coupled LC oscillator, including a single‐event transient hardened CMOS LC‐VCO circuit

Autor: Arumugam Karthigeyan, Sankararajan Radha, Esakkimuthu Manikandan
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: IET Circuits, Devices and Systems, Vol 16, Iss 2, Pp 178-188 (2022)
Druh dokumentu: article
ISSN: 1751-8598
1751-858X
DOI: 10.1049/cds2.12094
Popis: Abstract Single‐event transients (SETs) due to heavy‐ion (HI) strikes adversely affect the electronic circuits in the sub‐100 nm regime in the radiation environment. This study proposes techniques to mitigate SETs in CMOS voltage‐controlled oscillators (VCOs) without affecting the circuit specifications. A circuit asymmetry technique is used for faster recovery of the oscillator in the event of a single event transient (SET) caused by an ion hit. Also, a new SET tolerant inductor capacitor‐voltage controlled oscillator (LC‐VCO) topology is proposed for a radiation environment that shows reduced phase displacement, amplitude displacement, and recovery time. A comparison has been made with various LC‐VCOs that have an inherent rad‐hard capability which proves a significant improvement in SET sensitivity.
Databáze: Directory of Open Access Journals
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