Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Autor:	Bing Ye, Li-Hua Mo, Tao Liu, You-Mei Sun, Jie Liu
Jazyk:	angličtina
Rok vydání:	2020
Předmět:	SRAM single-event upset on-orbit error rate low-energy proton Mathematics QA1-939
Zdroj:	Symmetry, Vol 12, Iss 12, p 2030 (2020)
Druh dokumentu:	article
ISSN:	2073-8994
DOI:	10.3390/sym12122030
Popis:	The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/bda3fafede1f44a8933b3489048a1811 Zobrazit plný text záznamu View record in DOAJ Plný text ve formátu PDF Plný text ve formátu HTML
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