Autor: |
D.R. Sahu, Tzu-Jung Wu, Sheng-Chang Wang, Jow-Lay Huang |
Jazyk: |
angličtina |
Rok vydání: |
2017 |
Předmět: |
|
Zdroj: |
Journal of Science: Advanced Materials and Devices, Vol 2, Iss 2, Pp 225-232 (2017) |
Druh dokumentu: |
article |
ISSN: |
2468-2179 |
DOI: |
10.1016/j.jsamd.2017.05.001 |
Popis: |
The NiO thin films were prepared by the electron beam evaporation method using synthesized sintered targets. As-prepared films were characterized using X-ray diffraction, scanning electron microscopy, UV–VIS spectroscopy and cyclic voltammetry. The thicker films were found to exhibit a well-defined structure and a well-developed crystallite size with greater transmittance modulation and durability. The as-deposited thinner films of 170 nm showed a faster response time during electrochromic cycles with a coloration efficiency of 53.1 C/cm2 than the thicker ones. However, the thicker films showed no enhanced electrochromic properties such as a larger intercalated charge than the thinner ones. The electrochromic properties of the thinner films became deteriorated after 800 cycling tests. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
|