Computation of aberration coefficients for plane-symmetric reflective optical systems using Lie algebraic methods

Autor: Barion Antonio, Anthonissen Martijn J. H., ten Thije Boonkkamp Jan H. M., IJzerman Wilbert L.
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: EPJ Web of Conferences, Vol 266, p 02002 (2022)
Druh dokumentu: article
ISSN: 2100-014X
DOI: 10.1051/epjconf/202226602002
Popis: The Lie algebraic method offers a systematic way to find aberration coefficients of any order for plane-symmetric reflective optical systems. The coefficients derived from the Lie method are in closed form and solely depend on the geometry of the optical system. We investigate and verify the results for a single reflector. The concatenation of multiple mirrors follows from the mathematical framework.
Databáze: Directory of Open Access Journals