| Autor: |
Yihong Wu, Ying Wang, Jiayi Wang, Miao Zhou, Aihua Zhang, Chun Zhang, Yanjing Yang, Younan Hua, Baoxi Xu |
| Jazyk: |
angličtina |
| Rok vydání: |
2012 |
| Předmět: |
|
| Zdroj: |
AIP Advances, Vol 2, Iss 1, Pp 012132-012132-12 (2012) |
| Druh dokumentu: |
article |
| ISSN: |
2158-3226 |
| DOI: |
10.1063/1.3684617 |
| Popis: |
Metal/two-dimensional carbon junctions are characterized by using a nanoprobe in an ultrahigh vacuum environment. Significant differences were found in bias voltage (V) dependence of differential conductance (dI/dV) between edge- and side-contact; the former exhibits a clear linear relationship (i.e., dI/dV ∝ V), whereas the latter is characterized by a nonlinear dependence, dI/dV ∝ V3/2. Theoretical calculations confirm the experimental results, which are due to the robust two-dimensional nature of the carbon materials under study. Our work demonstrates the importance of contact geometry in graphene-based electronic devices. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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