Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

Autor: Jiří Vanek, Jan Dolensky, Zdenek Chobola, Mirek Luňák, Aleš Poruba
Jazyk: angličtina
Rok vydání: 2012
Předmět:
Zdroj: International Journal of Photoenergy, Vol 2012 (2012)
Druh dokumentu: article
ISSN: 1110-662X
1687-529X
DOI: 10.1155/2012/324853
Popis: This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.
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