Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization
Autor: | Jiří Vanek, Jan Dolensky, Zdenek Chobola, Mirek Luňák, Aleš Poruba |
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Jazyk: | angličtina |
Rok vydání: | 2012 |
Předmět: | |
Zdroj: | International Journal of Photoenergy, Vol 2012 (2012) |
Druh dokumentu: | article |
ISSN: | 1110-662X 1687-529X |
DOI: | 10.1155/2012/324853 |
Popis: | This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process. |
Databáze: | Directory of Open Access Journals |
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