Defectronics based photoelectrochemical properties of Cu2+ ion doped hematite thin film

Autor: Chang Woo Kim, Amol U. Pawar, Thomi Hawari, Na Hyeon Ahn, Don Keun Lee, Long Yang, Ramesh Poonchi Sivasankaran, Jun Tang, Zhongbiao Zhuo, Young Soo Kang
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Scientific Reports, Vol 12, Iss 1, Pp 1-9 (2022)
Druh dokumentu: article
ISSN: 2045-2322
DOI: 10.1038/s41598-022-20045-6
Popis: Abstract The concentration of guest elements (dopants) into host materials play an important role in changing their intrinsic electrical and optical properties. The existence of hetero-element induce defect in crystal structure, affecting conductivity. In the current work, we report Cu2+ ion into hematite in the defectronics point of view and their photoelectrochemical properties. Crystal distortion in the structure of hematite is observed as the amount of dopant increases. Among 1, 3 and 5 mol% of Cu2+ doped hematite, the existence of 1 mol% of Cu2+ ion into hematite crystal structure produce photocurrent value of 0.15 mA/cm2, IPCE value of ~ 4.7% and EIS value of ~ 2000 Ω/cm2 as best performances. However, further increasing dopants increases the number of interstitial defects, which cause the deformation of intrinsic lattice structure.
Databáze: Directory of Open Access Journals
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