| Autor: |
Panfilova S. P., Vlasov A. I., Gridnev V. N., Chervinsky A. S. |
| Jazyk: |
English<br />Russian |
| Rok vydání: |
2007 |
| Předmět: |
|
| Zdroj: |
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 6, Pp 42-49 (2007) |
| Druh dokumentu: |
article |
| ISSN: |
2225-5818 |
| Popis: |
The possibility of application of thermography to diagnose the electronic devices is analyzed in the article. Typical faults of electronic devices which can be found by means of thermography are given. Advantages of noncontact thermal inspection in comparison with the contact one are described. Some features of thermography of electronic devices are considered. Thermography apparatus is viewed and some pieces of advice about choosing it for electronic devices diagnosis are given. An example of the thermographic method for checking the electronic devices is provided. The main features of software used in thermography and its significance are described. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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