| Autor: |
Ivanskiy V. B., Dushkin S. A., Kurov A. M., Odinets V. A., Orobinskiy A. N. |
| Jazyk: |
English<br />Russian |
| Rok vydání: |
2011 |
| Předmět: |
|
| Zdroj: |
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 3, Pp 44-49 (2011) |
| Druh dokumentu: |
article |
| ISSN: |
2225-5818 |
| Popis: |
Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measurement and calculation of features of X-ray installation with requirements to errors of standard X-ray radiation features with narrow spectrum on DSTU ISO 4037-1:2006. Criteria of choosing the additional filters thickness for measurement 1st HVL and 2nd HVL are defined. The errors resulting from calculation of mean photon energy of X-ray radiation and homogeneity coefficient are specified. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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