| Autor: |
Jie Huang, Jun Gu, Xuelei Feng, Yong Shen |
| Jazyk: |
angličtina |
| Rok vydání: |
2022 |
| Předmět: |
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| Zdroj: |
Applied Sciences, Vol 12, Iss 3, p 1420 (2022) |
| Druh dokumentu: |
article |
| ISSN: |
2076-3417 |
| DOI: |
10.3390/app12031420 |
| Popis: |
This study investigates the diffraction effects of the IEC 63034 standard micro–baffle (SMB) on the frequency response (FR) measurements of microspeakers based on the extended Biot–Tolstoy–Medwin technique. Two different cases with and without the consideration of the backward diffractions of the SMB were investigated, which correspond to different practical measurement conditions of microspeaker drivers and closed-box microspeaker modules. The experimental results obtained were consistent with the theoretical analysis and numerical calculations. Normalized FR curves characterizing the SMB diffraction effects were presented, which can be used to compensate the FRs measured on the SMB to obtain the results measured on an ideal infinite baffle and eliminate the SMB diffraction effects. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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