Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement
| Autor: | Jin-Seob Kang |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Journal of Electromagnetic Engineering and Science, Vol 22, Iss 6, Pp 656-664 (2022) |
| Druh dokumentu: | article |
| ISSN: | 2671-7255 2671-7263 |
| DOI: | 10.26866/jees.2022.6.r.135 |
| Popis: | The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods. |
| Databáze: | Directory of Open Access Journals |
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