| Autor: |
Valencia-Alvarado R, de la Piedad-Beneitez A, López-Callejas R, Rodríguez-Méndez B G, Mercado-Cabrera A, Peña-Eguiluz R, Muñoz-Castro A E, de la Rosa-Vázquez J M |
| Jazyk: |
English<br />French |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
MATEC Web of Conferences, Vol 67, p 06075 (2016) |
| Druh dokumentu: |
article |
| ISSN: |
2261-236X |
| DOI: |
10.1051/matecconf/20166706075 |
| Popis: |
Using as target a CpTi disk in an atmosphere of argon/oxygen and by rf plasma. First titanium dioxide (TiO2) films were obtained on silicon substrates, and subsequently, these films were doped with nitrogen (N-TiO2). In both processes, along four hours at 390°C of temperature. X-Ray diffraction and Raman spectroscopy confirmed the presence of the nanostructured anatase phase. X-ray photoelectron spectroscopy analyzes indicate that the nitrogen atoms were incorporated into the TiO2 film with ~33.9 at%. The films reach a thickness of 1.25 μm and 40 nm the average uniformity determined by using an atomic force microscope. Finally, UV-Vis diffuse reflectance spectroscopy outcome evaluated ones an energy band gap reduction from 3.17 eV to 2.95 eV corresponding to TiO2 films and N-TiO2 films respectively. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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