Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Autor: Chris E. Finlayson, Giselle Rosetta, John J. Tomes
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Applied Sciences, Vol 12, Iss 10, p 4888 (2022)
Druh dokumentu: article
ISSN: 2076-3417
DOI: 10.3390/app12104888
Popis: The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.
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