On-Chip Tests for the Characterization of the Mechanical Strength of Polysilicon

Autor: Tiago Vicentini Ferreira do Valle, Aldo Ghisi, Stefano Mariani, Gabriele Gattere, Francesco Rizzini, Luca Guerinoni, Luca Falorni
Jazyk: angličtina
Rok vydání: 2022
Předmět:
Zdroj: Engineering Proceedings, Vol 27, Iss 1, p 10 (2022)
Druh dokumentu: article
ISSN: 2673-4591
DOI: 10.3390/ecsa-9-13363
Popis: Microelectromechanical systems (MEMS) are nowadays widespread in the sensor market, with several different applications. New production techniques and ever smaller device geometries require a continuous investigation of potential failure mechanisms in such devices. This work presents an experimental on-chip setup to assess the geometry- and material-dependent strength of stoppers adopted to limit the deformation of movable parts, using an electrostatically actuated device. A series of comb-finger and parallel plate capacitors are used to provide a rather large stroke to a shuttle, connected to the anchors through flexible springs. Upon application of a varying voltage, failure of stoppers of variable size is observed and confirmed by post-mortem ΔC–V curves. The results of the experimental campaign are collected to infer the stochastic property of the strength of polycrystalline, columnar silicon films.
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