Autor: |
Daeyeal Lee, Chia-Tung Ho, Ilgweon Kang, Sicun Gao, Bill Lin, Chung-Kuan Cheng |
Jazyk: |
angličtina |
Rok vydání: |
2021 |
Předmět: |
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Zdroj: |
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 7, Iss 1, Pp 52-60 (2021) |
Druh dokumentu: |
article |
ISSN: |
2329-9231 |
DOI: |
10.1109/JXCDC.2021.3089095 |
Popis: |
Many-tier vertical gate-all-around nanowire FET (VFET) synthesis strongly demands a holistic approach of modeling/formulating/optimizing transistor placement and in-cell routing to obtain the maximum-achievable power, performance, area, and cost (PPAC) benefits. In this article, we propose a novel satisfiability modulo theories (SMT)-based many-tier VFET standard cell (SDC) synthesis framework that simultaneously solves place-and-route (P&R). We devise an extended relative positioning constraint and a dummy gate control scheme to capture the unique VFET cell architecture. Moreover, we present efficient objectives to improve pin-accessibility and reduce the use of vertical routing, which has high resistance. Compared to the conventional sequential P&R approach, our concurrent P&R achieves a 15.2% smaller cell area on average for 2-tier VFET. Throughout the extensive exploration for many-tier VFET configurations up to 4-tier, we show that the 4-tier VFET respectively achieves 50.1% and 27.9% of average area reduction on chip-level and block-level, over 4.5T GAAFET. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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