Magnetic and optical properties of the nickel thin film deposited by GLAD technique

Autor: Potočnik Jelena M., Nenadović Miloš T., Novaković Mirjana M., Rakočević Zlatko Lj.
Jazyk: English<br />Serbian
Rok vydání: 2014
Předmět:
Zdroj: Tehnika, Vol 69, Iss 1, Pp 15-18 (2014)
Druh dokumentu: article
ISSN: 0040-2176
2560-3086
DOI: 10.5937/tehnika1401015P
Popis: In this work, nickel thin film was deposited on glass sample using Glancing Angle Deposition (GLAD) technique, to a thickness of 1 μm. Glass sample was positioned 15 degrees with respect to the nickel vapor flux. The nickel thin film was characterized by Atomic Force Microscopy (AFM), Magneto- Optical Kerr effect Microscopy and Spectroscopic Ellipsometry. According to an AFM cross-section imaging, it was found that the nickel thin film has a columnar structure. The values of the coercively, obtained from the magnetic hysteresis loops, were analyzed as a function of the sample rotation in the magnetic field. It was found that the direction of magnetization easy axis lies toward the structure growth. Optical properties of the nickel thin film were studied at the wavelength of 455 nm. From the shape of the refractive index and the extinction coefficient diagrams could be concluded that the nickel thin film has an optical anisotropy.
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