| Autor: |
Chankeun Yoon, Gihun Choe, Changhwan Shin |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
IEEE Journal of the Electron Devices Society, Vol 8, Pp 365-372 (2020) |
| Druh dokumentu: |
article |
| ISSN: |
2168-6734 |
| DOI: |
10.1109/JEDS.2020.2983197 |
| Popis: |
The energy-delay sensitivity of a nanoelectromechanical (NEM) relay and an NEM relay with the negative capacitance of a ferroelectric capacitor (NC + NEM relay) are theoretically investigated. The energy-delay characteristics of the NC + NEM relay deteriorate compared to those of the NEM relay when its movable beam becomes shorter/thicker than the critical beam length/thickness. The energy-delay characteristics of the NC + NEM relay (vs. the NEM relay) can be improved by increasing/decreasing the movable beam length/thickness. However, the maximum length and minimum thickness of the movable electrode are specified. This is necessary to avoid stuck-on failure. This study provides guidelines for improving the switching energy-delay characteristics and the operating voltage of the NC + NEM relay (vs. the NEM relay) by optimizing the device design variables. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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