Estimation of WSe2 Layer Thickness using Reflectance Spectra and Comparison with Graphene based on Wavelength

Autor: Bhavyasri V., Chandra Kishore S.
Jazyk: English<br />French
Rok vydání: 2024
Předmět:
Zdroj: E3S Web of Conferences, Vol 477, p 00033 (2024)
Druh dokumentu: article
ISSN: 2267-1242
20244770
DOI: 10.1051/e3sconf/202447700033
Popis: The purpose of this study is to calculate the WSe2 layer thickness using reflectance spectra and comparison with graphene using wavelength in the Novel 2D material reflectance spectra Using nanoHUB.org, the study’s data was gathered. According to clinicalcalc.com, samples were categorized as (N=20) for WSe2 layers and (N=20) for graphene layers. The total sample size was calculated while maintaining the following values: alpha error-threshold value = 0.05, enrollment ratio = 0.1, 95% confidence interval = 80%, and G-power = 80%. Comparison is done by independent sample test using SPSS software. There is a statistically significant difference in the thickness of the WSe2 layer and Graphene layer with (p=.001, p
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