On the Sensitivity of Electron-Injection Detectors at Low Light Level

Autor: Vala Fathipour, Iman Hassani Nia, Alireza Bonakdar, Hooman Mohseni
Jazyk: angličtina
Rok vydání: 2016
Předmět:
Zdroj: IEEE Photonics Journal, Vol 8, Iss 3, Pp 1-7 (2016)
Druh dokumentu: article
ISSN: 1943-0655
DOI: 10.1109/JPHOT.2016.2558508
Popis: We present the signal-to-noise performance of a short-wave infrared detector, which offers an internal avalanche-free gain. The detector is based on a similar mechanism as the heterojunction phototransistor and takes advantage of a type-II band alignment. Current devices demonstrate a noise-equivalent sensitivity of ~670 photons at 260 K and over a linear dynamic range of 20 dB. While this level of sensitivity is about an order of magnitude better than an ideal p-i-n detector attached to the same low-noise amplifier, it was still limited by the amplifier noise (~2600 electrons root mean square) due to the insufficient device gain. Performance comparison with other SWIR detector technologies demonstrates that the so-called electron-injection detectors offer more than three orders of magnitude better noise-equivalent sensitivity compared with state-of-the-art phototransistors operating at similar temperature.
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