| Autor: |
Arti Pareek, Roopmati Meena, Rajesh Gupta |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
SiliconPV Conference Proceedings, Vol 1 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2940-2123 |
| DOI: |
10.52825/siliconpv.v1i.867 |
| Popis: |
The reliability of photovoltaic (PV) modules is essential for ensuring a smooth operation over the anticipated timespan while operating outside. Examining the degradation in field-exposed photovoltaic (FEPV) modules will help to identify the possible degradation modes that can affect PV module performance and functioning. In this paper, to identify the major modes of degradation in Indian subtropical climate conditions, 20-year-old FEPV modules have been investigated by cross-characterization using dark lock-in thermography (DLIT) and electroluminescence (EL) imaging. Cross-characterization using EL and DLIT images has been helpful in investigation of various modes of degradations in FEPV modules in the presence of multiple degradations. Encapsulant and busbar ribbon interface degradations have been identified as the two main modes of degradation observed in Indian sub-tropical climate conditions. Minor degradations include finger interruptions and cell cracks. A major effect of degradation has been observed on the fill factor and short circuit current, which have decreased by up to 30% and 40%, respectively. The results presented in this paper can be used to understand degradation occurring in a sub-tropical climate and for the non-destructive analysis of degradations in the FEPV modules. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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