| Autor: |
Kyeong-Soo Kang, Jin-Kyu Lee, Ji-Min Kang, Soo-Yeon Lee |
| Jazyk: |
angličtina |
| Rok vydání: |
2021 |
| Předmět: |
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| Zdroj: |
IEEE Journal of the Electron Devices Society, Vol 9, Pp 311-317 (2021) |
| Druh dokumentu: |
article |
| ISSN: |
2168-6734 |
| DOI: |
10.1109/JEDS.2021.3058348 |
| Popis: |
In this article, we propose a novel real-time threshold voltage ( $V_{th}$ ) compensation method for AM-OLED display. The proposed method predicts $V_{th}$ shift of driving thin-film transistors (TFTs) based on the equation derived from the sensing line charging with TFT’s drain current. The prediction equation requires two consecutive source node voltages to consider the mobility variation, and only takes hundreds of microseconds to predict $V_{th}$ shift. It is short enough to monitor the real-time $V_{th}$ degradation, since the prediction can be carried out during the vertical blank time. Also, very high prediction accuracy was confirmed through Smart SPICE simulation. We simulated severe mobility variation and $V_{th}$ shift circumstances, and the simulation results showed that the prediction error was less than one just noticeable difference (JND) margin though out all gray levels. We expect that the proposed method can achieve more accurate and faster real-time $V_{th}$ degradation compensation for high resolution and large-sized OLED displays than conventional one. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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