Atomic resolution microstructure study of Bi-doped SrTiO3
| Autor: | Chao Li, Yijun Zhang, Guohua Dong, Guangliang Hu, Guang Yang, Chaoqiang Liu, Houwen Chen, Xiaoyong Wei |
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| Jazyk: | angličtina |
| Rok vydání: | 2024 |
| Předmět: | |
| Zdroj: | Journal of Advanced Dielectrics, Vol 14, Iss 06 (2024) |
| Druh dokumentu: | article |
| ISSN: | 2010135X 2010-1368 2010-135X |
| DOI: | 10.1142/S2010135X24500048 |
| Popis: | Intrinsic SrTiO3 is a quantum paraelectric, but moderately Bi-doped SrTiO3 exhibits dielectric frequency dispersion similar to relaxor ferroelectrics. In this paper, detailed electron microscopic studies of the microstructures of Bi-doped SrTiO3 samples were presented. It was found that the Sr sites were replaced by off-central Bi, resulting in tensile strain in the strontium titanate (STO) lattice. In the Bi-doped SrTiO3 samples, the valence of titanium mainly showed the Ti[Formula: see text] characteristic. According to the dielectric behavior and microstructure analysis, the polar nanoregions (PNRs) composed of strained SrTiO3 nanoclusters should be responsible for the ferroelectric relaxor behavior in samples with moderate Bi content. |
| Databáze: | Directory of Open Access Journals |
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