Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
| Autor: | Gritcov S. S., Sorokin G. F., Shestacova T. V. |
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| Jazyk: | English<br />Russian |
| Rok vydání: | 2018 |
| Předmět: | |
| Zdroj: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 3-9 (2018) |
| Druh dokumentu: | article |
| ISSN: | 2225-5818 2309-9992 |
| DOI: | 10.15222/TKEA2018.5-6.03 |
| Popis: | This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests. |
| Databáze: | Directory of Open Access Journals |
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