Virtual-diagnostic-based time stamping for ultrafast electron diffraction

Autor: F. Cropp, L. Moos, A. Scheinker, A. Gilardi, D. Wang, S. Paiagua, C. Serrano, P. Musumeci, D. Filippetto
Jazyk: angličtina
Rok vydání: 2023
Předmět:
Zdroj: Physical Review Accelerators and Beams, Vol 26, Iss 5, p 052801 (2023)
Druh dokumentu: article
ISSN: 2469-9888
DOI: 10.1103/PhysRevAccelBeams.26.052801
Popis: In this work, nondestructive virtual diagnostics are applied to retrieve the electron beam time of arrival and energy in a relativistic ultrafast electron diffraction (UED) beamline using independently measured machine parameters. This technique has the potential to improve the temporal resolution of pump and probe UED scans. Fluctuations in time of arrival have multiple components, including a shot-to-shot jitter and a long-term drift which can be separately addressed by closed loop feedback systems. A linear-regression-based model is used to fit the beam energy and time of arrival and is shown to be able to predict accurate behavior for both long- and short-time scales. More advanced time-series analysis based on machine learning techniques can be applied to improve this prediction further.
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