Increase of noise immunity of photomask images binarization in the space of the wavelet transform

Autor: Shcherbakova G. Yu., Dilevsky A. A., Krylov V. N., Logvinov O. V., Plachinda O. E.
Jazyk: English<br />Russian
Rok vydání: 2011
Předmět:
Zdroj: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 6, Pp 23-26 (2011)
Druh dokumentu: article
ISSN: 2225-5818
Popis: An information technology for histogram analysis and a method for noise immunity binary processing of integrated and printed circuits board photo-masks image based on this technology was carryed out. This method based on the sub-gradient iterative noise stability optimization method satisfies the demands of the automated optical control of photo-masks and printed circuits in the error and noise immunity. The maximum binary processing error does not exceed 1 pixel if the signal-to-noise ratio is more than 7.
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