| Autor: |
Edoardo Cappelli, Willem O. Tromp, Siobhan McKeown Walker, Anna Tamai, Marta Gibert, Felix Baumberger, Flavio Y. Bruno |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
APL Materials, Vol 8, Iss 5, Pp 051102-051102-6 (2020) |
| Druh dokumentu: |
article |
| ISSN: |
2166-532X |
| DOI: |
10.1063/1.5143316 |
| Popis: |
Thin films of the correlated transition-metal oxide LaNiO3 undergo a metal–insulator transition when their thickness is reduced to a few unit cells. Here, we use angle-resolved photoemission spectroscopy to study the evolution of the electronic structure across this transition in a series of epitaxial LaNiO3 films of thicknesses ranging from 19 u.c. to 2 u.c. grown in situ by RF magnetron sputtering. Our data show a strong reduction in the electronic mean free path as the thickness is reduced below 5 u.c. This prevents the system from becoming electronically two-dimensional, as confirmed by the largely unchanged Fermi surface seen in our experiments. In the insulating state, we observe a strong suppression of the coherent quasiparticle peak, but no clear gap. These features resemble previous observations of the insulating state of NdNiO3. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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