| Autor: |
L G Guzman, L C Sánchez, J Gil Monsalve, C Ostos, O Arnache |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
Materials Research Express, Vol 11, Iss 9, p 096403 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2053-1591 |
| DOI: |
10.1088/2053-1591/ad78ae |
| Popis: |
Thin films of Ni-Zn ferrite grown on MgO(111) single crystal substrate were prepared using radiofrequency magnetron sputtering, with a target of nominal composition Ni _0.5 Zn _0.5 Fe _2 O _4 . Subsequently, x-ray diffraction (XRD) was performed, which revealed characteristic reflections of a Ni-Zn ferrite structure, confirming the unique formation of the ferrite. X-ray photoelectron spectroscopy (XPS) revealed the presence of metal ions in their appropriate valence states within the crystalline structure of the Ni-Zn ferrite. The variation in binding energy observed in the thin film is attributed to changes in the environment of Fe ^3+ and Zn ^2+ or Ni ^2+ ions, resulting from the non-equilibrium distribution of cations in tetrahedral and octahedral sites. The saturation magnetization and the coercivity field were $7.05{\mu }_{{\rm{B}}}/{\rm{cell}}$ and 513 ± 32 Oe, respectively. In addition, ferromagnetic resonance studies were made using broad-band FMR spectroscopy based on a coplanar waveguide (CPW) spectrometer. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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