Conformity Check of Thickness to the Crystal Plate λ/4(λ/2)

Autor: Alexander Syuy, Dmitriy Shtarev, Victor Krishtop, Natalia Kireeva
Jazyk: angličtina
Rok vydání: 2013
Předmět:
Zdroj: Journal of Spectroscopy, Vol 2013 (2013)
Druh dokumentu: article
ISSN: 2314-4920
2314-4939
DOI: 10.1155/2013/875809
Popis: This work demonstrates that if crystal plates are identical in thickness in the direction of radiation, the intensity at the output of the polarizer-crystal-crystal-analyzer system equals zero. This means that it is possible to control the difference in thickness between the reference crystal plate (e.g., plates of λ/4 or λ/2) and the examined plate by the intensity of the transmitted radiation. Further, it shows that if nonmonochromatic radiation is used, then the spectrum of radiation at the output is determined by the relative orientation of the optical elements and their sizes. The paper gives the theoretical model for calculations of profile of spectra for the number of important cases of orientation of elements.
Databáze: Directory of Open Access Journals
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