Investigation of Defect Formation in Silicon Doped with Silver and Gadolinium Impurities by Raman Scattering Spectroscopy
Autor: | Sharifa B. Utamuradova, Shakhrukh Kh. Daliev, Elmira M. Naurzalieva, Xushnida Yu. Utemuratova |
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Jazyk: | English<br />Russian<br />Ukrainian |
Rok vydání: | 2023 |
Předmět: | |
Zdroj: | East European Journal of Physics, Iss 3, Pp 430-433 (2023) |
Druh dokumentu: | article |
ISSN: | 2312-4334 2312-4539 |
DOI: | 10.26565/2312-4334-2023-3-47 |
Popis: | Silicon doped with gadolinium and silver impurities were studied using a Renishaw InVia Raman spectrometer. Registration and identification of both crystalline and amorphous phase components in the samples was carried out. Some changes are observed in the Raman spectra of gadolinium-doped silicon samples compared to the initial sample. It has been experimentally found that an increase in the silver impurity concentration in gadolinium-doped silicon leads to a smoothing of the Raman spectrum, which indicates the formation of a more perfect crystal structure. |
Databáze: | Directory of Open Access Journals |
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