Autor: |
Rao Janardhana, Revathi K., Bhanusree Yalamanchili, Odugu Venkata Krishna, Babu Gade Harish |
Jazyk: |
English<br />French |
Rok vydání: |
2024 |
Předmět: |
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Zdroj: |
E3S Web of Conferences, Vol 472, p 02010 (2024) |
Druh dokumentu: |
article |
ISSN: |
2267-1242 |
DOI: |
10.1051/e3sconf/202447202010 |
Popis: |
Image inpainting can be used to fix broken images and get rid of distracting elements. In exemplar based methods, patch priority computation and exemplar patch selection are crucial to the success of image inpainting technique. The dropping effect occurred in the highest patch priority computation and matching error in the best patch selection are the major issues in the exemplar inpaint methods. In this paper, the enhanced priority calculation technique is employed to avoid the dropping effect and introduced the new similarity measuring process, Mean Squared Error (MSD). The efficacy of the proposed techniques is estimated by comparing with the available methods in the literature qualitatively. It shows that proposed methods outperformed existing techniques. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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