High Impedance Fault Models for Overhead Distribution Networks: A Review and Comparison with MV Lab Experiments

Autor: Juan Carlos Huaquisaca Paye, João Paulo A. Vieira, Jonathan Muñoz Tabora, André P. Leão, Murillo Augusto M. Cordeiro, Ghendy C. Junior, Adriano P. de Morais, Patrick E. Farias
Jazyk: angličtina
Rok vydání: 2024
Předmět:
Zdroj: Energies, Vol 17, Iss 5, p 1125 (2024)
Druh dokumentu: article
ISSN: 1996-1073
DOI: 10.3390/en17051125
Popis: Detecting and locating high impedance faults (HIF) in overhead distribution networks (ODN) remains one of the biggest challenges for manufacturers and researchers due to the complexity of this phenomenon, where the electrical current magnitude is similar to that of the loads. To simulate HIF, the selection of the HIF model is important, because it has to correctly reproduce the characteristics of this phenomenon, so that it does not negatively influence the simulations results. Therefore, HIF models play a fundamental role in proposing solutions and validating the effectiveness of the proposed methods to detect and localize HIF in ODN. This paper presents a systematic review of HIF models. It is intended to facilitate the selection of the HIF model to be considered. The models are validated based on experimental data from medium voltage (MV) laboratories, specifically, recorded waveforms from two HIF tests conducted in an MV lab were analyzed and compared with three established HIF models. The efficacy of these models was assessed against MV lab test data to ensure a precise representation of both transient and steady-state conditions for fault conductance and current waveforms. The findings show that the two nonlinear resistor models better approximate the waveforms obtained in the experimental tests performed in this study.
Databáze: Directory of Open Access Journals
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