Spin-polarized scanning tunneling microscopy experiments on the rough surface of a polycrystalline NiFe film with a fine magnetic tip sensitive to a well-defined magnetization component

Autor: H. Matsuyama, D. Nara, R. Kageyama, K. Honda, T. Sato, K. Kusanagi, E. Srinivasan, K. Koike
Jazyk: angličtina
Rok vydání: 2016
Předmět:
Zdroj: AIP Advances, Vol 6, Iss 3, Pp 035122-035122-6 (2016)
Druh dokumentu: article
ISSN: 2158-3226
DOI: 10.1063/1.4944951
Popis: We developed a micrometer-sized magnetic tip integrated onto the write head of a hard disk drive for spin-polarized scanning tunneling microscopy (SP-STM) in the modulated tip magnetization mode. Using SP-STM, we measured a well-defined in-plane spin-component of the tunneling current of the rough surface of a polycrystalline NiFe film. The spin asymmetry of the NiFe film was about 1.3% within the bias voltage range of -3 to 1 V. We obtained the local spin component image of the sample surface, switching the magnetic field of the sample to reverse the sample magnetization during scanning. We also obtained a spin image of the rough surface of a polycrystalline NiFe film evaporated on the recording medium of a hard disk drive.
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