| Autor: |
Joel Stryhalski, Luis César Fontana, Marcos Fernando Odorczyk, Juliano Sadi Scholtz, Julio César Sagás, Abel André Candido Recco |
| Jazyk: |
angličtina |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
Materials Research, Vol 17, Iss 6, Pp 1545-1549 (2014) |
| Druh dokumentu: |
article |
| ISSN: |
1516-1439 |
| DOI: |
10.1590/1516-1439.271314 |
| Popis: |
This paper reports the effect of pulsed bias in comparison with DC bias on reactive deposition of Ti6Al4V-N films, obtained by Grid Assisted Magnetron Sputtering. The results obtained by X-Ray diffraction (XRD), Energy Dispersive X-ray Fluorescence Spectrometer (EDX) and Atomic Force Microscopy (AFM) show that bias condition affects the crystalline texture and change the roughness and morphology of the films. The DC bias favors the film crystallinity, however the pulsed bias produces smoother films. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
|
