On the Limitations of Positron Annihilation Spectroscopy in the Investigation of Ion-Implanted FeCr Samples

Autor: Vladimir Slugen, Jarmila Degmova, Stanislav Sojak, Martin Petriska, Pavol Noga, Vladimir Krsjak
Jazyk: angličtina
Rok vydání: 2021
Předmět:
Zdroj: Metals, Vol 11, Iss 11, p 1689 (2021)
Druh dokumentu: article
ISSN: 2075-4701
DOI: 10.3390/met11111689
Popis: New materials for advanced fission/fusion nuclear facilities must inevitably demonstrate resistance to radiation embrittlement. Thermal and radiation ageing accompanied by stress corrosion cracking are dominant effects that limit the operational condition and safe lifetime of the newest nuclear facilities. To study these phenomena and improve the current understanding of various aspects of radiation embrittlement, ion bombardment experiments are widely used as a surrogate for neutron irradiation. While avoiding the induced activity, typical for neutron-irradiated samples, is a clear benefit of the ion implantation, the shallow near-surface region of the modified materials may be a complication to the post-irradiation examination (PIE). However, microstructural defects induced by ion implantation can be effectively investigated using various spectroscopic techniques, including slow-positron beam spectroscopy. This method, typically represented by techniques of positron annihilation lifetime spectroscopy and Doppler broadening spectroscopy, enables a unique depth-profile characterisation of the near-surface region affected by ion bombardment or corrosion degradation. One of the best slow-positron beam facilities is available at the pulsed low-energy positron system (PLEPS), operated at FRM-II reactor in Munich (Germany). Bulk studies (such as high energy ion implantation or neutron irradiation experiments) can be, on the other hand, effectively performed using radioisotope positron sources. In this paper, we outline some basics of the two approaches and provide some recommendations to improve the validity of the positron annihilation spectroscopy (PAS) data obtained on ion-irradiated samples using a conventional 22Na positron source.
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