Three-dimensional structural comparison of tantalum glancing angle deposition thin films by FIB-SEM
| Autor: | T. Ott, D. Roldán, C. Redenbach, K. Schladitz, M. Godehardt, S. Höhn |
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| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: | |
| Zdroj: | Journal of Sensors and Sensor Systems, Vol 8, Pp 305-315 (2019) |
| Druh dokumentu: | article |
| ISSN: | 2194-8771 2194-878X |
| DOI: | 10.5194/jsss-8-305-2019 |
| Popis: | Thin tantalum films generated by glancing angle deposition serve as functional optical layers, for instance as absorption layers for ultrathin infrared sensors. They consist of nano-rods whose dimensions and distribution influence the optical properties of the thin film. Serial sectioning by a focused ion beam combined with scanning electron microscopy of the slices generates stacks of highly resolved images of this nanostructure. Dedicated image processing reconstructs the spatial structure from this stack such that 3-D image analysis yields geometric information that can be related to the optical performance. |
| Databáze: | Directory of Open Access Journals |
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