Electronic structure of buried LaNiO3 layers in (111)-oriented LaNiO3/LaMnO3 superlattices probed by soft x-ray ARPES

Autor: F. Y. Bruno, M. Gibert, S. McKeown Walker, O. E. Peil, A. de la Torre, S. Riccò, Z. Wang, S. Catalano, A. Tamai, F. Bisti, V. N. Strocov, J.-M. Triscone, F. Baumberger
Jazyk: angličtina
Rok vydání: 2017
Předmět:
Zdroj: APL Materials, Vol 5, Iss 1, Pp 016101-016101-7 (2017)
Druh dokumentu: article
ISSN: 2166-532X
DOI: 10.1063/1.4973558
Popis: Taking advantage of the large electron escape depth of soft x-ray angle resolved photoemission spectroscopy, we report electronic structure measurements of (111)-oriented [LaNiO3/LaMnO3] superlattices and LaNiO3 epitaxial films. For thin films, we observe a 3D Fermi surface with an electron pocket at the Brillouin zone center and hole pockets at the zone vertices. Superlattices with thick nickelate layers present a similar electronic structure. However, as the thickness of the LaNiO3 is reduced, the superlattices become insulating. These heterostructures do not show a marked redistribution of spectral weight in momentum space but exhibit a pseudogap of ≈50 meV.
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