| Autor: |
Logoglu Faruk, Surani Stuti, Flaska Marek |
| Jazyk: |
angličtina |
| Rok vydání: |
2023 |
| Předmět: |
|
| Zdroj: |
EPJ Web of Conferences, Vol 288, p 10015 (2023) |
| Druh dokumentu: |
article |
| ISSN: |
2100-014X |
| DOI: |
10.1051/epjconf/202328810015 |
| Popis: |
Recently, it has been shown through both Monte Carlo simulations and experiments that scintillator-PMT interface reflection coefficients could depend on crystal thickness. It has been argued that the thickness-dependency on the interface reflection coefficient is a result of bulk attenuation and surface reflections. So far, only LYSO:Ce3+ scintillators have been tested to investigate thickness-dependent reflection coefficients. In this work, the simulations and experiments are extended to GAGG:Ce3+ crystals. Moreover, a new experimental technique (the dualPMT setup) has been tested to measure the interface reflection coefficients, and it has been shown through the dual-PMT setup that GAGG:Ce3+-PMT interface reflection coefficients are thickness-dependent with more than 1σ confidence. These results are also supported with extensive Monte Carlo simulations. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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