Microdetector system for speedy X-ray studies

Autor:	O. S. Kovalchuk, V. V. Burdin, V. A. Kyva, V. M. Militsiya, M. V. Minakov, Ie. O. Petrenko, V . M. Pugatch, D. I. Storozhyk, J. Heuser, S. O. Firstov, A. V. Chaus
Jazyk:	English<br />Russian<br />Ukrainian
Rok vydání:	2016
Předmět:	X-rays diffraction position sensitive detectors transient phase transformations temperature dependence of phase transformations in metals microstrip silicon detectors Atomic physics. Constitution and properties of matter QC170-197
Zdroj:	Âderna Fìzika ta Energetika, Vol 17, Iss 4, Pp 400-405 (2016)
Druh dokumentu:	article
ISSN:	1818-331X 2074-0565
Popis:	Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/ec6b31ecb9fe4c54bdc70adc68b1f4af Zobrazit plný text záznamu View record in DOAJ