| Popis: |
Ensuring product quality and integrity is paramount in the rapidly evolving landscape of industrial manufacturing. Although effective to a certain degree, traditional quality control methods often fail to meet the demands for efficiency, accuracy, and adaptability in today’s fast-paced production environments. The advent of Deep Learning (DL) and Computer Vision (CV) technologies has opened new vistas for automated defect detection, promising to revolutionize the way industries approach quality control and inspection. This systematic review focuses on recent advancements in DL and CV applications for automated defect detection in manufacturing processes. It provides a comprehensive overview of state-of-the-art techniques for detecting, classifying, and predicting defects, highlighting the significant strides made in addressing challenges such as varying lighting conditions, complex defect patterns, and the seamless integration of these technologies into existing manufacturing workflows. Through a critical analysis of current methodologies, this study identifies key areas of opportunity, outlines the challenges that persist and suggests directions for future research. This review synthesizes findings from a broad spectrum of industrial applications, offering insights into the potential of DL and CV to enhance quality control mechanisms. By charting the progress and pinpointing the gaps in current practices, this paper aims to serve as a valuable resource for researchers, practitioners, and policymakers seeking to leverage the benefits of DL and CV for improved product management and manufacturing excellence. |
