| Autor: |
Kathryn M. Sturge, Noah Hoppis, Aneesh Anandanatarajan, Ariana M. Bussio, Bryson C. Clifford, Emily H. Frashure, Miriam E. Hiebert, James E. Krutzler, Timothy W. Koeth |
| Jazyk: |
angličtina |
| Rok vydání: |
2024 |
| Předmět: |
|
| Zdroj: |
APL Materials, Vol 12, Iss 3, Pp 031119-031119-6 (2024) |
| Druh dokumentu: |
article |
| ISSN: |
2166-532X |
| DOI: |
10.1063/5.0191534 |
| Popis: |
Dielectric charging aboard spacecraft and satellites is a persistent and pressing issue in materials design and applications. This study investigated the effect of electron irradiation on charge trapping and leakage properties in polymethyl methacrylate, which is necessary for determining the maximum permissible fluence of radiation before the material is pushed beyond its breakdown threshold in charged particle radiation-intense environments. It was observed that dielectric breakdown in the form of an electrostatic discharge event cannot be induced under the conditions of this experiment after an amount of time that is dependent on initial electron fluence. This time limit for which an electrostatic discharge can be induced was found to be longer for the lower beam current irradiations. The work presented here discusses the factors affecting charge leakage using a global electric field-driven model. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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