| Autor: |
Thuc Hue Ly, David J. Perello, Jiong Zhao, Qingming Deng, Hyun Kim, Gang Hee Han, Sang Hoon Chae, Hye Yun Jeong, Young Hee Lee |
| Jazyk: |
angličtina |
| Rok vydání: |
2016 |
| Předmět: |
|
| Zdroj: |
Nature Communications, Vol 7, Iss 1, Pp 1-7 (2016) |
| Druh dokumentu: |
article |
| ISSN: |
2041-1723 |
| DOI: |
10.1038/ncomms10426 |
| Popis: |
Grain boundaries can degrade the performance of electronic devices made from single atomic layers of transition metal dichalcogenides. Here, the authors combine transport measurements and transmission electron microscopy to find a correlation between field-effect mobility and grain misorientation angle. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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