Аssociation of spectral closeness of flicker-noise parameters with features of underlying structure of system

Autor: Kolodiy Z. A., Kruk O. H., Sanots’kyy Y. V., Holynskyy V. D., Kolodiy A. Z., Depko P. I.
Jazyk: English<br />Russian
Rok vydání: 2009
Předmět:
Zdroj: Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 1, Pp 10-14 (2009)
Druh dokumentu: article
ISSN: 2225-5818
Popis: The results of computer design of chaotic motion of elementary particles are resulted in a flat rectangle which can be put in accordance to a pellicle resistor with the electrons of conductivity. The analysis of spectral closeness of chaotic motion shows that one of parameters of flicker-noise depends only on the amount of elementary particles and middle rate of their movement. The second parameter of flicker-noise (time of relaxation) depends on the features of underlying structure of the system. It can be used for prognostication of reliability as separate elements of electronics so apparatus as a whole on the measured level of their flicker-noise.
Databáze: Directory of Open Access Journals