Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy

Autor: Oku Takeo
Jazyk: angličtina
Rok vydání: 2012
Předmět:
Zdroj: Nanotechnology Reviews, Vol 1, Iss 5, Pp 389-425 (2012)
Druh dokumentu: article
ISSN: 2191-9089
2191-9097
DOI: 10.1515/ntrev-2012-0018
Popis: High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostructured materials such as boride and oxide materials was described and the high-resolution imaging methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles. An aberration correction technique is also expected as an advanced nanostructure analysis with higher resolution. The HREM image of TlBa2Ca3Cu4O11 was taken with the incident beam parallel to the a axis together with a structure model after image processing.
Databáze: Directory of Open Access Journals