Autor: |
A.Z. Simões, A.H.M. Gonzalez, M.A. Zaghete, J.A. Varela, B.D. Stojanovic |
Jazyk: |
angličtina |
Rok vydání: |
2000 |
Předmět: |
|
Zdroj: |
Materials Research, Vol 3, Iss 3, Pp 68-73 (2000) |
Druh dokumentu: |
article |
ISSN: |
1516-1439 |
DOI: |
10.1590/S1516-14392000000300004 |
Popis: |
Lead lanthanum zirconate titanate [PLZT (9/65/35)] thin films were prepared by dip-coating on Si (100) or Si/Ti/Pt (100) substrates using a polymeric precursor solution and annealed at 650 °C for 3 h. Perovskite phase formation of the PLZT thin films and microstructure were analysed using XRD and SEM. Effects of Si (100), Si/Ti/Pt (100) substrates and atmosphere on crystallization of PLZT thin films were studied. Films deposited on platinum coated silicon (100) show a heterogeneous surface with presence of bubbles. Otherwise, the PLZT (9/65/35) thin films deposited on silicon (100) substrate shows a more uniform surface after annealing in oxygen atmosphere. |
Databáze: |
Directory of Open Access Journals |
Externí odkaz: |
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