Testing and verification of a novel single-channel IGBT driver circuit

Autor:	Lukić Milan, Ninković Predrag
Jazyk:	English<br />Serbian
Rok vydání:	2016
Předmět:	driver circuit power switch IGBT transistor integrated circuit undervoltage lockout desaturation Electrical engineering. Electronics. Nuclear engineering TK1-9971
Zdroj:	Zbornik Radova: Elektrotehnički Institut "Nikola Tesla", Vol 26, Iss 26, Pp 53-68 (2016)
Druh dokumentu:	article
ISSN:	0350-8528 2406-1212
DOI:	10.5937/zeint26-12304
Popis:	This paper presents a novel single-channel IGBT driver circuit together with a procedure for testing and verification. It is based on a specialized integrated circuit with complete range of protective functions. Experiments are performed to test and verify its behaviour. Experimental results are presented in the form of oscilloscope recordings. It is concluded that the new driver circuit is compatible with modern IGBT transistors and power converter demands and that it can be applied in new designs. It is a part of new 20kW industrial-grade boost converter.
Databáze:	Directory of Open Access Journals
Externí odkaz:	https://doaj.org/article/620ed8c534bf41c08e262dd69491fa09 Zobrazit plný text záznamu View record in DOAJ