| Autor: |
Ronchieri Elisabetta, Canaparo Marco, Belgiovine Mauro, Salomoni Davide, Martelli Barbara |
| Jazyk: |
angličtina |
| Rok vydání: |
2020 |
| Předmět: |
|
| Zdroj: |
EPJ Web of Conferences, Vol 245, p 05041 (2020) |
| Druh dokumentu: |
article |
| ISSN: |
2100-014X |
| DOI: |
10.1051/epjconf/202024505041 |
| Popis: |
Software defect prediction is an activity that aims at narrowing down the most likely defect-prone software modules and helping developers and testers to prioritize inspection and testing. This activity can be addressed by using Machine Learning techniques applied to software metrics datasets that are usually unlabelled, i.e. they lack modules classification in terms of defectiveness. To overcome this limitation, in addition to the usual data pre-processing operations to manage mission values and/or to remove inconsistencies, researches have to adopt an approach to label their unlabelled software datasets. The extraction of defectiveness data to label all the instances of the datasets is an extremely time and effort consuming operation. In literature, many studies have introduced approaches to build a defect prediction models on unlabelled datasets. In this paper, we describe the analysis of new unlabelled datasets from WLCG software, coming from HEP-related experiments and middleware, by using Machine Learning techniques. We have experimented new approaches to label the various modules due to the heterogeneity of software metrics distribution. We discuss a number of lessons learned from conducting these activities, what has worked, what has not and how our research can be improved. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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