| Autor: |
A. Crippa, R. Ezzouch, A. Aprá, A. Amisse, R. Laviéville, L. Hutin, B. Bertrand, M. Vinet, M. Urdampilleta, T. Meunier, M. Sanquer, X. Jehl, R. Maurand, S. De Franceschi |
| Jazyk: |
angličtina |
| Rok vydání: |
2019 |
| Předmět: |
|
| Zdroj: |
Nature Communications, Vol 10, Iss 1, Pp 1-6 (2019) |
| Druh dokumentu: |
article |
| ISSN: |
2041-1723 |
| DOI: |
10.1038/s41467-019-10848-z |
| Popis: |
Gate-reflectometry is a recently demonstrated measurement technique for single spin states in silicon. It is potentially able to perform quantum non-demolition measurements and uses compact circuitry that can be scaled up to larger quantum computers. Crippa et al. successfully combine gate-reflectometry qubit readout and coherent control. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
|
