| Autor: |
Myeongjin Kim, Hyun Soon Park |
| Jazyk: |
angličtina |
| Rok vydání: |
2022 |
| Předmět: |
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| Zdroj: |
Applied Microscopy, Vol 52, Iss 1, Pp 1-6 (2022) |
| Druh dokumentu: |
article |
| ISSN: |
2287-4445 |
| DOI: |
10.1186/s42649-022-00071-4 |
| Popis: |
Abstract With the lightening of the mobile devices, thinning of electrolytic copper foil, which is mainly used as an anode collection of lithium secondary batteries, is needed. As the copper foil becomes ultrathin, mechanical properties such as deterioration of elongation rate and tear phenomenon are occurring, which is closely related to microstructure. However, there is a problem that it is not easy to prepare and observe specimens in the analysis of the microstructure of ultrathin copper foil. In this study, electron backscatter diffraction (EBSD) specimens were fabricated using only mechanical polishing to analyze the microstructure of 8 μm thick electrolytic copper foil in plane view. In addition, EBSD maps and transmission electron microscopy (TEM) images were compared and analyzed to find the optimal cleanup technique for properly correcting errors in EBSD maps. |
| Databáze: |
Directory of Open Access Journals |
| Externí odkaz: |
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